The Company: In the production sample taken from the site, multiple metallic particulate contaminants were observed in a processing equipment. The samples were collected on a swab and the particulates were isolated from the swab and rapidly underwent instrumental analysis at Nishka.

The Solution: Images obtained by SEM Hitachi S-3700N SEM in backscatter electron detection mode were used to distinguish between the atomic number of the elements. The particles were separately analysed and found to be consistent with stainless steel swarf.

The Client’s Benefits: This non-destructive approach allowed us to characterize the particulate contaminant and identify the source of contamination. In this case, it was found to be production equipment with compromised integrity due to prolonged usage.