Atomic Force Microscopy

Studying the topography of a micro-sample has been difficult. But not anymore! With atomic force microscopy, the probe can generate a graphical response based on a scratching movement or periodic oscillation.

Studying various microscopic objects involve a lot of techniques, some restricted to the study of chemical behaviors while some are for physical detection. But, none has proven to be as extensive as that of the atomic force microscopy process. This method is used for studying the topographical diversions of any object and yields a highly magnified image based on all three axes.

AFM technique has proven itself to be capable enough for making milestone discoveries in the microscopic material field. Here, a probe is used for studying the topographical variations and disturbances of any particle with a size outside the human’s line of vision. atomic force microscopy basics. The probe has a sharp tip that traces the surface while the laser beam incident on the top is reflected on a screen, which further records the graphical representation. AFM testing lab. This mapped graph is then exposed to different imaging techniques that finally yield the sample’s magnified image under testing.

1. Contact AFM: Here, in this technique, the probe is made to trace the surface topography with the constant scratch motion on the sample. The graphical representation obtained is a continuous line with no brakes.
2. Non-contact AFM: In this, the tip of the probe oscillates at a small angle so that it can come in minimal contact with the sample’s surface. The graph generated by this method has alternate points and gaps, and hence, it is considered to be far more accurate.

AFM has been in use at Nishka’s Research and testing fields for years now. With this special microscopic study process, we make sure to solve every kind of problem faced by our clients, be it in topographical surface studies or knowing more about the surface disturbances.

During the course of, we have extended our services fields like:

• Nanotechnology: Here, the probe is used to determine the surface of different types of nanotechnology materials with each.
• Cell and molecular biology: Microscopic studies are more essential in the biology and medical field. This is why we offer unparalleled services to both fields.
• Crystal studies are the piezoelectric crystals or the gems; our AFM skilled analysts and testers will provide you with proper graphical representations of the crystal’s surface.
• Surface detection and analysis: Another major field where we have gained a spot in the limelight is the surface analysis of different materials and processed under varied environments.

At Nishka Research, precision, reliability, and innovation define our AFM testing services. We combine industry-leading equipment with a team of highly trained experts to deliver high-resolution surface imaging and detailed topographical analysis with unmatched accuracy. Whether it’s nanotechnology, molecular biology, or material sciences, our solutions are tailored to meet the unique demands of every research domain.

Our laboratories follow strict quality control protocols to ensure contamination-free testing and consistent results. We utilize both contact and non-contact AFM techniques, enabling us to adapt our approach based on the sensitivity of the sample and the depth of detail required.

With years of hands-on experience in microscopic analysis, our specialists are well-equipped to interpret complex data and provide clear, actionable insights. From startups to large research institutions, clients choose Nishka Research for our unwavering commitment to scientific excellence and fast turnaround times—making us a trusted partner in precision surface analysis.

Looking for a trusted partner to achieve your research goals? schedule a meeting with us, send us a request, or call us at +91 78427 98518 to learn more about our services and how we can support you.