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Atomic Force Microscopy

Atomic Force Microscopy (AFM) Investigation / AFM Testing

Studying the topography of a micro-sample has been difficult. But not anymore! With atomic force microscopy, the probe can generate a graphical response based on a scratching movement or periodic oscillation.

Studying various microscopic objects involve a lot of techniques, some restricted to the study of chemical behaviors while some are for physical detection. But, none has proven to be as extensive as that of the atomic force microscopy process. This method is used for studying the topographical diversions of any object and yields a highly magnified image based on all three axes.

At Nishka, we use top-level equipment to deliver prospective results to our clients from both scientific and technological fields alike. We believe that AFM allows an imaging process like no other, and that is why our team puts all the effort into ensuring that the graphical and statistical studies are up to the mark.

AFM technique utility for microscopic studies at Nishka

AFM technique has proven itself to be capable enough for making milestone discoveries in the microscopic material field. Here, a probe is used for studying the topographical variations and disturbances of any particle with a size outside the human’s line of vision. atomic force microscopy basics. The probe has a sharp tip that traces the surface while the laser beam incident on the top is reflected on a screen, which further records the graphical representation. afm testing lab. This mapped graph is then exposed to different imaging techniques that finally yield the sample’s magnified image under testing.

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AFM process types used at Nishka for surface imaging and detection

Nishka has become one of the best research and testing companies, and with our expert resources and special equipment, we make sure to provide the best services. This is why here we practice both the AFM procedures- contact and non-contact AFM, based on what the requirement of the test sample is and also that of your clients.

  1. Contact AFM: here, in this technique, the probe is made to trace the surface topography with the constant scratch motion on the sample. The graphical representation obtained is a continuous line with no brakes.
  2. Non-contact AFM: in this, the tip of the probe oscillates at a small angle so that it can come in minimal contact with the sample’s surface. The graph generated by this method has alternate points and gaps, and hence, it is considered to be far more accurate.
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  • Aerospace
  • Automotive
  • Biomedical/biotechnology
  • Compound Semiconductor
  • Data Storage
  • Defense
  • Displays
  • Electronics
  • Industrial Products
  • Lighting
  • Pharmaceutical
  • Photonics
  • Polymer
  • Semiconductor
  • Solar Photovoltaics
  • Telecommunications
Our expert AFM solutions

AFM has been in use at Nishka’s research and testing fields for years now. With this special microscopic study process, we make sure to solve every kind of problem faced by our clients, be it in topographical surface studies or knowing more about the surface disturbances.

During the course of, we have extended our services fields like:

  • Nanotechnology: here, the probe is used to determine the surface of different types of nanotechnology materials with each.
  • Cell and molecular biology: microscopic studies are more essential in the biology and medical field. This is why we offer unparalleled services to both fields.
  • Crystal studies are the piezoelectric crystals or the gems; our AFM skilled analysts and testers will provide you with proper graphical representations of the crystal’s surface.
  • Surface detection and analysis: another major field where we have gained a spot in the limelight is the surface analysis of different materials and processed under varied environments.
Our expertise with AFM
Our all experts has years of experience, which has made them capable enough to study different macroscopic objects under testing and provide the best result. We ensure to examine the topography of the substance in different conditions to get a series of representations, which are then sorted to obtain a marvelous but magnified replica.

Nishka Research

NISHKA has been helping customers unlock their full potential and realize their true value for more than 13 years by providing innovative and bespoke solutions to ensure the highest standards.
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Nishka Research Pvt. Ltd.

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4th floor, Gumidelli Commercial Complex,
1-10-39 to 44, Old Airport Road, Begumpet,
Hyderabad-500016
India

Phone : +91 40 29303155

Mobile : +91 7842798518

Send Mail : [email protected]
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Left us a 4 star review

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December 14, 2021
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April 27, 2022
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December 14, 2021
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June 2, 2022

Great work done by nishka research. Thank you so much for your kind Co operation

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December 14, 2021
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Keyur Butani
May 10, 2022

Submitted the samples for my phd work . Great work and reports submited with 2 days of time . Also the image clarity and all data are clear .

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December 14, 2021
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October 12, 2020

I am a PhD scholar from Kaunas University at Lithuania, Europe. I have given a sample to perform SEM analysis of the organic tissue. The results are highly satisfactory and impressive. The service was really excellent, on time( even before the time schedule), consumer friendly. cost to the academic samples are very less comparing with others. Once again thanks to Nishka for providing me the service ontime as I am really in urgency...

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Thank you for your services.. Looking forward for more collaboration with your labs for my future projects..

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October 30, 2020

A very good lab delivering acurate results. I must also mention about the very cordial staff that they have.

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